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J.Y. Laval, J.L. Maurice, C. Cabanel

Public reference bibliography and cataloged PDF materials authored or published by J.Y. Laval, J.L. Maurice, C. Cabanel.

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Impurity-induced microstructure of grain boundaries in cast silicon. Incidence on electrical properties

Year: 1987 • Source: hal.science • Listed PDF

The role of impurities in polysilicon for photocell has been investigated. Aluminium and carbon residual impurities in the Bridgman and HEM materials were particularly considered. The combination of local electrical, che...