Home » Authors » T. Kempf, V. Della Marca, L. Baron, F. Maugain, F. La Rosa, S. Niel, A. Regnier, Jean-Michel Portal, P. Masson

T. Kempf, V. Della Marca, L. Baron, F. Maugain, F. La Rosa, S. Niel, A. Regnier, Jean-Michel Portal, P. Masson

Public reference bibliography and cataloged PDF materials authored or published by T. Kempf, V. Della Marca, L. Baron, F. Maugain, F. La Rosa, S. Niel, A. Regnier, Jean-Michel Portal, P. Masson.

Found 1 document(s) Page 1 of 1

Threshold voltage bitmap analysis methodology: Application to a 512kB 40nm Flash memory test chip

Year: 2018 • Source: hal.science • Listed PDF

The reliability requirements of Flash memory become more and more challenging. Flash memory technology development needs test chips to allow large statistical studies and a product-like approach. In this paper, we presen...