Microelectronics research on silicon-silicon oxide structures and interfaces third quarterly report, 1 dec. 1964 - 28 feb. 1965
Overview & Synopsis
Electron microscopy calculations in minimum and maximum capacitance theories for silicon-silicon oxide structures and interfaces
Indexed from repository: NASA Technical Reports Server
(
ntrs.nasa.gov)
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Document Information
| Document Title | Microelectronics research on silicon-silicon oxide structures and interfaces third quarterly report, 1 dec. 1964 - 28 feb. 1965 |
|---|---|
| Author / Organization | National Aeronautics and Space Administration (NASA) |
| Subject & Discipline | CONTRACTOR_REPORT |
| Categories | Aerospace & Aviation |
| Publication Year | 2019 |
| License / Rights | Public Domain / NASA STI Open Access |
| Resource Verification | Listed PDF (Verification Pending) |
| Original Host Website |
NASA Technical Reports Server
(ntrs.nasa.gov)
|
| File Format | application/pdf (Portable Document Format) |
| Language | EN |
| Catalog ID | DOC-82367 |
| Original Source Link | Visit Source Page on ntrs.nasa.gov » |