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Towards Electrical, Integrated Implementations of SIMPL Systems
Ulrich Rührmair, Qingqing Chen, Martin Stutzmann, Paolo Lugli, Ulf Schlichtmann, György Csaba

Towards Electrical, Integrated Implementations of SIMPL Systems

Science & Mathematics Published 2010 Verification Pending

Overview & Synopsis

This paper discusses strategies for the electrical, integrated implementation of a novel security tool termed SIMPL system, which was introduced in [1]. SIMPL systems are a public key version of Physical Unclonable Functions (PUFs). Like a PUF, each SIMPL system S is physically unique and non-reproducible, and implements an individual function FS. In opposition to a PUF, every SIMPL system S possesses a publicly known numerical description D(S), which allows its digital simulation and prediction. However, any such simulation must work at a detectably lower speed than the real-time behavior of S. As argued in [1], SIMPL systems have practicality and security advantages over PUFs, Certificates of Authenticity (COAs), Physically Obfuscated Keys (POKs), and also over standard mathematical cryptotechniques. This manuscript focuses on electrical, integrated realizations of SIMPL systems, and proposes two potential candidates: SIMPL systems derived from special SRAM-architectures (so-called "skew designs" of SRAM cells), and implementations based on analog computing arrays called Cellular Non-Linear Networks (CNNs).

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Document Information

Document Title Towards Electrical, Integrated Implementations of SIMPL Systems
Author / Organization Ulrich Rührmair, Qingqing Chen, Martin Stutzmann, Paolo Lugli, Ulf Schlichtmann, György Csaba
Subject & Discipline Multidisciplinary Academic Open Research
Categories Science & Mathematics
Publication Year 2010
License / Rights Open Access / Creative Commons
Resource Verification Listed PDF (Verification Pending)
Original Host Website HAL Open Science (hal.science)
File Format application/pdf (Portable Document Format)
Language EN
Catalog ID DOC-166759
Original Source Link Visit Source Page on hal.science »